UT, IT & BBT

Test » UT, IT & BBT

SW testing is a major part of the validation process for an electronic company that develops embedded firmware. For this reason, Generation RFID has integrated into the development process custom automatic testing tools for the validation of this firmware. In this sense, Unit Testing (UT), Integration Testing (IT) and Black Box Testing (BBT) are critical tests that assure the firmware under test performs robustly under all operating scenarios.

Generation RFID