Generation RFID develops test projects and tools to assure the quality of the manufactured products. Our experience covers fields such as In Circuit Testing (ICT), Functional Testing (FKT) for the validation of high volume, high speed electronic products and Automated Optical Inspection (AOI) for visual quality control. In this sense, we have developed specifit tooling to implement the necessary tests, such as Bed-of-Nails (BON), Load Panels for EMC and functional validation and Test Scheduller SW for the definition of the test cases.
Our product portfolio covers all the possibilities related to testing electronic for the validation of any type of devices under test (DUT). In this sense, we can develop custom testers, integrate testers of the shelf and deliver a complete manual ATE equipment. With all this possibilities and depending on the customer requirements, ICT or EOL-Functional test can be implemented.
During the development of the electrical or electronic products, it is necessary to perform the validation of it. In this sense, Generation RFID develops and customizes any type of HW and SW necessary for this purpose.
Test Case Scheduler for EOL DUT verification is a high level software application which allows the user the easy implementation and definition of the multiple test cases that configure the DUT functional test.
The need for high quality products and costs reduction in production environments make automated optical inspection into a key step in the quality assurance process.